반도체 소스 측정 장치(SMU)
For semiconductor test applications we offer two families of Source Measure Units. The Series 2600A System SourceMeter family’s Test Script Processor (TSP®) architecture and capability for high-speed pulse mode measurements, parallel test execution and precision timing provides the industry’s highest throughput, lowering the cost of test. Our Model 2410 High Voltage SourceMeter is an excellent choice for resistors and voltage coefficient testing, varistors, and high voltage diodes, including switching, zener, RF diodes, and rectifiers, whereas our Model 2430 1kW Pulse SourceMeter is ideal for measuring the breakdown voltage of many types of high-power devices, including multi-layer varistors (MLVs) and semiconductor components.
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