Keithley Instruments Inc. - 반도체 파라미터 테스트 시스템

반도체 파라미터 테스트 시스템

Keithley’s S530 Semiconductor Parametric Test Systems are engineered to handle all the DC and C-V measurements required in process control monitoring, process reliability monitoring, and device characterization, and are designed for use in production and lab environments that entail a broad range of devices and technologies.

Selector Guides

S530 베이직

Industry’s most cost-effective fully automatic parametric tester

Compatible with popular fully automatic probers

Cabled-out configuration maximizes prober interface flexibility

Supports 5-inch probe card libraries

Proven instrumentation technology ensures high measurement accuracy and repeatability

S530 저전류

pA current measurement capability

Low leakage measurement integrity

20W SMUs provide up to 1A or 200V

Configurable up to 8 SMUs and 60 pins

Optional adapter extends guarding to probe

Compatible with popular fully automatic probers

C-V measurements up to 1MHz

S530 고전압

Source up to 1000V at 10mA

High voltage leakage and breakdown testing

Low leakage measurement integrity

pA current measurement capability

20W SMUs provide up to 1A or 200V

Configurable up to 7 SMUs and 32 pins

Optional adapter extends guarding to probe

Compatible with popular fully automatic probers

C-V measurements up to 1MHz

실행취소 작업