반도체 파라미터 분석기
For parametric testing that maximizes the productivity of technicians and engineers in R&D, the Model 4200-SCS Semiconductor Characterization System combines lab-grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution in a fully integrated characterization system. Options include the Model 4210-CVU Capacitance-Voltage Unit, Model 4225-PMU Ultra-Fast I-V Module, Model 4220-PGU Pulse Generator Unit, and Model 4225-RPM Remote Amplifier/Switch. Keithley’s ACS Basic Edition software is optimized for component and discrete (packaged) semiconductor device testing.
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