Keithley Instruments Inc. - 반도체 특성분석 소프트웨어

반도체 특성분석 소프트웨어

Our Automated Characterization Suite (ACS) software offers powerful solutions for automating semiconductor characterization at the device, wafer, or cassette level. ACS Integrated Test Systems fill the gap between interactive lab-based tools and high-speed production test tools. ACS Basic Edition is optimized for bench-top parametric testing of component and discrete (packaged) semiconductor devices, maximizing the productivity of technicians and engineers in R&D. ACS-WLR (Wafer Level Reliability) Integrated Test Systems allow the creation of lifetime predictions from two to five times faster than do conventional WLR test solutions, accelerating technology development, process integration, and process monitoring for faster time to market.

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ACS 시스템

Automated Characterization Suite (ACS) Test Systems

All-in-one solution: from test setup to analyzing results

Compatible with popular fully automatic probers

Intuitive GUI

No coding needed–even for multi test characterization

Script editor for specialized test development

Easy-to-use applications library

For benchtop and automated rack-based systems

ACS 베이직 에디션

Model ACS Basic Edition Automated Characterization Suite for Component Characterization

Semiconductor component characterization

Failure analysis

Easily adapted to new technology applications

Library of hundreds of standard device tests

Supports full range of Keithley SourceMeter instruments and more

WLR용 ACS

Interactive interface optimized for parallel SMU-per-pin testing

Compliant with most JEDEC standard test methods

Powerful and flexible stress/measure sequencing capability

Formulator for parameter analysis and line fits

Monitor real-time test results

실행취소 작업