- 어플리케이션 노트
- #803 Varistor Verification with the 2400 Digital SourceMeter
- #804 IDDQ Testing and Standby Current Testing with the Series 2400 SourceMeter
- #805 Configuring a Discrete Resistor Verification Test System
- #807 Battery Discharge/Charge Cycling Using Keithley Series 2400 SourceMeter
- Using Two Model 2400 SourceMeter Instruments to Source up to 2 Amps
- #1805 Diode Production Testing with the Series 2400 SourceMeter
- #1818 Configuring a Resistor Network Production Test System with the Model 2400
- #2202 Production Testing of GMR Heads with the Model 2400 and Model 7001
- #2273 VCSEL Testing with the Model 2400 SourceMeter Instrument
- #1953 Measuring Photovoltaic Cell I-V Characteristics with the Model 2420
- #1805 Diode Production Testing with the Series 2400 SourceMeter - QuickBASIC Example Programs
- Determining output resistance for the 2400 Series SourceMeter
- #2402 DC Production Testing of OLED Displays
- #810 Optimizing Switch/Read Rates with Series 2000 DMMs and 7001/7002 Switch Systems
- Quick Reference Guide to SCPI Commands
- Automatic Resistance Measurements on High Temperature Superconductors
- #2124 Production Testing of High Current Varistors with the 2430C 1kW Pulse SourceMeter
- Word 6.0 File Discussing the Issues of Ohms Accuracy with the 2400 Series
- Technical Note for SourceMeter Buffers and How to Get Up to 5000 Data Points Using the Two Buffers
- 2400 Series Timestamping Technical Note
- #2217 Trigger Synchronization of Multiple SourceMeter Instruments
- #806 Production Testing of Thermistors Using the 2400 Digital SourceMeter
- Can I generate current (or voltage) pulses with model 2400 or other non-pulse mode SourceMeter?
- Eliminating Common SCPI Errors
- Device Characterization Techniques Using Keithley SourceMeter Instruments with LabTracer Software
- Migrating Test Applications from the Keithley Model 2400 SourceMeter SMU Instrument to a Series 2600B System SourceMeter SMU Instrument
- #2214 High-Throughput DC Production Test of Telecommunications Laser Diode Modules
- DC Electrical Characterization of RF Power Transistors
- How to Choose and Apply Source Measure Unit SMU Instruments
- 2218 Production Testing of High-Intensity Visible LEDs
- #2208 Solutions for Production Testing of Connectors
- #2616 Converting a Series 2400 SourceMeter SCPI Application to a Series 2600 System SourceMeter Script Application
- Methods to Achieve Higher Currents from I-V Measurement Equipment
- Electrical Characterization of Photovoltaic Materials and Solar Cells with the Model 4200-SCS Semiconductor Characterization System
- Guide to Measuring New Materials and Devices
- #3026 - Electrical Characterization of Photovoltaic Materials and Solar Cells with the Model 4200-SCS Semiconductor Characterization System
- 기사
- Increasing RF Device Test Throughput with Better Instrument Coordination
- From Lab to Fab ? Get the Testing Right
- Better Solar Cell Testing: The Key to Faster Development and Production
- Combining the Benefits of LXI and Scripting
- Using Forward Voltage to Measure Semiconductor Junction Temperature
- 제품 자료
- High Accuracy Electrometers for Low Current/High Resistance Applications
- Source Measure Unit Instruments - The Tool of Choice for Emerging R&D Applications
- Series 2400 SourceMeter Family
- Discover the Industry Standard for LED Electrical Test
- Electrical Measurement of High Brightness LED Electrical E-Guide
- E-Guide to Solving Today's Material and Device Characterization Challenges
- Advances in Electrical Measurements for Nanotechnology E-Handbook
- Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
- Simplify Your Solar Cell Testing with Keithley's Precision Measurement Solutions
- E-Guide: Re-Inventing High Power Semiconductor and Device Characterization
- Real-world Instruments for Your Electrical Engineering Labs
- Solutions for Educational Labs and University-Based Researchers
- New Materials and Devices E-Guide
- E-Handbook to Understanding Electrical Test and Measurement
- 데이터 시트
- SourceMeter Instruments for Optoelectronic I-V Testing
- Series 2400 SourceMeter Line
- Technical Information - Source Measurement Unit (SMU) Instruments
- 2013 Bench Products Test and Measurement Solutions
- FAQ
- Sweep: How many different types of Sweeps can a SourceMeter perform?
- Feature: Do the series 2400 SourceMeter instruments have any math functions?
- Sweep: Can Source Memory sweeps be programmed over the front panel?
- Sweep: Which instrument parameters are saved in each Source Memory location?
- Sweep: How many discrete points can be programmed into a sweep?
- Sweep: What is the Source Memory feature?
- Remote Operation: Does it matter if I use upper or lower case characters when sending commands?
- Remote Operation: Which communication buses do the SourceMeter Instruments support?
- Feature: How do I change the source value?
- Ohms: How do I select 4-wire ohms measurement?
- Speed: How can I refresh the auto zero values once at the beginning of a test sequence?
- Speed: Can the auto zero function be disabled?
- Feature: What is the auto zero function?
- Speed: In what circumstances might I need to use a measurement speed other than Normal?
- Speed: What is the difference between 'source delay' and 'trigger delay'?
- Ohms: What is the offset-compensated ohms function and why is it necessary?
- Speed: How do I change the soak time for a measurement?
- Feature: What features make the SourceMeter line suitable for production testing?
- Specs: How does a SourceMeter instrument differ from a DMM?
- Feature: How do the various SourceMeter instruments differ from each other?
- Specs: How does the 2400-LV differ from the 2400?
- Ohms: What type solder can I use when I cannot make direct threaded connections to my sample?
- Ohms: What kind of connections are recommended for a low resistance measurement?
- Sweep: How do I configure the Model 2400 SourceMeter to perform a voltage sweep from LabVIEW (LV)?
- Specs: Voltage Burden Specification of SourceMeter Explained
- Remote Operation: Why do I get a VISA timeout (BFFF0015) using RS-232 with a SourceMeter?
- Amps: Which current source do you recommend to use with the Model 2182 Nanovoltmeter?
- Ohms: Which products are recommended for measuring in the range of 2 - 50 micro-ohms?
- Remote Operation: How can I program a SourceMeter Instrument to Measure Resistance?
- Remote Operation: What Front Panel Settings are Required to use the VXIPnP drivers for SourceMeter?
- Speed: What factors affect the speed of a SourceMeter?
- Speed: How fast can the 2400 series output a pulse?
- Ohms: What is AUTO or MANUAL mode when measuring Resistance with a 2400?
- Feature: What is the Contact Check option of a Source Meter?
- Ohms: How can I measure electron mobility of a thin film?
- Amps: What is the Output Resistance for the Current Source of a SourceMeter?
- Application Examples for SourceMeter Instruments
- Amps: When using a SourceMeter to measure only (no sourcing), why is the current negative?
- Sweep: Is it possible to send a command to the SourceMeter that will interrupt the sweep?
- Sweep: Can I use an external trigger to stop a SourceMeter sweep?
- Compliance: Can the measurement range be different than the compliance range?
- Compliance: What does it mean when the units for the compliance value blink on the front panel?
- Compliance: What does it mean when the CMPL (compliance) blinks on the front panel?
- Compliance: How do I change the compliance (CMPL) value?
- Ohms: Which SourceMeter instrument do you recommend for four-point probe measurement techniques?
- Remote Operation: What are VXIPnP Drivers?
- Compliance: What is Compliance Voltage on the Source-Measure Units and SourceMeter instruments?
- Remote Operation: Can I use GPIB cards from Agilent with Keithley's Instrument Drivers?
- Specs: What is Offset Compensation?
- Feature: What are the differences between a 236 and a 2400 type product?
- Speed: What would be a good instrument to use to measure di/dt?
- Ohms: How do you decide whether to use a two-probe method or a four-probe method for resistance?
- Specs: What is CMRR (Common Mode Rejection Ratio)?
- Troubleshooting: How do I limit ground loops?
- Specs: What are the effects on accuracy due to possible deterioration within calibration periods?
- Remote Operation: What VISA Resource Name is required when using the KPCMCIA-GPIB card (Ines)?
- Speed: What is NPLC?
- Specs: How Can I Apply an Accuracy Specification on a Data Sheet to my Specific Measurement?
- Handbook
- Advances in Electrical Measurements for Nanotechnology
- E-Guide to Solving Today's Material and Device Characterization Challenges
- Guide to Measuring New Materials and Devices
- 매뉴얼
- Series 2400 SourceMeter User's Manual
- Model 2400 SourceMeter Service Manual Rev. D
- Models 8501-1 and 8501-2 Trigger Link Cables
- Model 2400 Series SourceMeter Japanese User's Manual Rev. A (12.2MB)
- 2400 Series SourceMeter Quick Start Guide
- Model 4299-6 Universal Full Rack Mount Kit Installation Instructions
- 선택 가이드
- Source and Measure Products Selector Guide
- Optoelectronics Test Selector Guide
- 제품 규격
- Models 2400, 2401, 2400-LV and 2400-C SourceMeter Specifications
- 백서
- Designing a Semiconductor Characterization System for an Undergraduate Fabrication Lab
- Making Better Fuel Cells: Through-Plane Resistivity Measurement of Graphite-Filled Bipolar Plates
- Obtaining More Accurate Resistance Measurements Using the 6-Wire Ohms Measurement Technique
- Telecom Test Equipment Must Meet Tight Space Demands While Providing High Throughput, Accuracy
- Rapidly Expanding Array of Test Applications Continues to Drive Source Measurement Unit Instrument Technology (also Applicable to Series 2600B)
- New Test Realities for Evolving FPD Technologies
- Choosing the Optimal Source Measurement Unit Instrument for Your Test and Measurement Application (also Applicable to Series 2600B)
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